Webbspectrometry (PHI nano TOF II) and X-ray Photoelectron Spectroscopy (PHI 5000 Versaprobe Ⅲ). Depth profile of XPS was performed by the source of argon ion with the … WebbA TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis. PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with …
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http://mac.tec-lab.pref.gunma.jp/dt0541.html Webbdepth is 242.5 nm as shown in Figure 1(ii) and total sputtering duration is 820 s. ToF-SIMS data acquisition To measure the secondary ion counts, the PHI nano ToF II TRIFT was used from Physical Electronics, MN, USA. In this process, a 10 ns pulsed liquid metal ion gun (LMIG) uses Gallium (Ga+) sources to produce ions as primary ion bingo butterworth
Probing Surface Information of Alloy by Time of Flight-Secondary …
Webb1 nov. 2024 · The time-of-flight secondary ion mass spectroscopy (ToF-SIMS) depth profiles were obtained using an Ulvac-Phi PHI nano TOF II. The optical properties of the … WebbULVAC-PHI, Japan “Precise Mass Analysis of Organic Materials by PHI Nano-TOF II Equipped with Tandem MS/MS” Dr. Hossein Sepehri-Amin: NIMS, Japan “UV Laser … WebbIon Mass Spectrometry (ToF-SIMS, PHI nano TOF II). For XPS and TOF-SIMS characterization, the Ar-protected sample injection is performed using a transition . 4 … d2r red portal